(Sub)mm-wave RF Characterization test facility

ESA’s (Sub)mm-wave RF Characterization test facility is a quasi-optical free-space RF measurement bench that, when combined with a Network Analyser and analysis software, provides a powerful measurement tool for the determination of complex material properties. It allows the characterization of dielectrics, ferrites, reflective surfaces and a variety of printed structures, such as FSS, CPSS and half-wave plates. The set-up is installed in a controlled clean room environment ensuring adequate conditions for flight hardware testing.

The material is characterized by a single pass through the sample or single reflection on the sample, in transmission and reflection configuration, respectively. The main advantage of this system is the possibility of measuring samples with high absorption or thickness. Co-polar and cross-polar components of the transmission and reflection properties of the samples under test can be determined by using high performance corrugated horns, grids and refocusing mirrors.